Accepted abstracts by author > Jouan Pierre-Yves
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IN SITU XRD STUDIES, USING SYNCHROTRON RADIATION, OF THIN FILM GROWING BY REACTIVE SPUTTER MAGNETRON TECHNIQUE.
Jorge Feugeas, Juan Bürgi, Javier Garcia Molleja, Guinter Kellermann, Abdou Djouadi, Pierre-Yves Jouan, Aldo Craievich
sciencesconf.org:pbiid2013:12961 |
Influence of nitrogen content on CrSiN thin film properties deposited by reactive HiPIMS
Axel FERREC, Frédéric SCHUSTER, Pierre-Yves Jouan, Mohamed Abdou DJOUADI
sciencesconf.org:pbiid2013:14072 |
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